Patents provide powerful insights of technology development which is a key driver for economic growth as well as an important factor of economic analysis. In order to fully take advantage of these well-codified markers of new knowledge, it is necessary to master tools and methodologies to dig into patent information. The workshop aims at providing methodological and practical skills to analyse patent documents. It relies on the facilities RISIS Patent Database and the Cortext tool.
The Online Methodological course on Thematic and spatial analysis of technologies using Cortext and RISIS patent database is organized by Université Gustave Eiffel and will take place on an online platform on 8-10 November 2021.
The workshop will be centered on two dimensions of the technology analyses using patents: network analysis and geography. The first part of the workshop will be dedicated to an introduction to the use of patents for thematic and spatial analyses of technologies, introducing the participants to the RISIS Patent Database and the Cortext platform.
The call for application for the course on the Thematic and spatial analysis of technologies using Cortext and RISIS patent database is now open.
Deadline for a request of participation: 31st of October 2021.
Participants should have some basic notions about patents, IP, STI analysis, and data management (Excel, Access, or statistics software). It is not necessary for participants to have already used Cortext facilities.
The target audience includes senior scientists, early career researchers and PhD students -Policymakers at the local, regional, national and international level (e.g., European Commission) Research associations, up to 15 participants.
The course is part of RISIS Training activities
Further information: Thematic and spatial analysis of technologies using Cortext and RISIS patent database
